Fast neutron irradiation tests of flash memories used in space environment at the ISIS spallation neutron source

Fast neutron irradiation tests of flash memories used in space environment at the ISIS spallation neutron source

This paper presents a neutron accelerated study of soft errors in advanced electronic devices used in space missions, i.e. Flash memories performed at the ChipIr and VESUVIO beam lines at the ISIS spallation neutron source. The two neutron beam lines are set up to mimic the space environment spectra...

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Bibliographic Details
Main Authors: C. Andreani, R. Senesi, A. Paccagnella, M. Bagatin, S. Gerardin, C. Cazzaniga, C. D. Frost, P. Picozza, G. Gorini, R. Mancini, M. Sarno
Format: Article
Language:English
Published: AIP Publishing LLC 2018-02-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5017945

Internet

http://dx.doi.org/10.1063/1.5017945

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