Development of micron-sized Cu–Ag composite paste for oxidation-free bare Cu bonding in air condition and its deterioration mechanism during aging and power cycling tests

The development of next-generation power electronics requires the semiconductor power devices with higher voltage endurance, higher electrical current density under high-temperature operations above 250 °C. Herein, we propose the uses of combined micron-sized Cu particles with Ag–amino composite to...

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Bibliographic Details
Main Authors: Chuantong Chen, Dongjin Kim, Yang Liu, Takuya Sekiguchi, Yutai Su, Xu Long, Canyu Liu, Changqing Liu, Katsuaki Suganuma
Format: Article
Language:English
Published: Elsevier 2023-05-01
Series:Journal of Materials Research and Technology
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785423010694