Electromagnetic influences and pulsing hardness of integrated circuits
The results of the single pulsing electrical overstress (EOS) series with energy below the threshold of failure for modern submicron IC’s design are presented. The study was conducted on two types of modern sub-micron VLSI. The obtained results confirm the possibility of accumulation of the effects...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Joint Stock Company "Experimental Scientific and Production Association SPELS
2016-10-01
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| Series: | Безопасность информационных технологий |
| Subjects: | |
| Online Access: | https://bit.mephi.ru/index.php/bit/article/view/20 |