PU-MFA: Point Cloud Up-Sampling via Multi-Scale Features Attention

Recently, research using point clouds has been increasing with the development of 3D scanner technology. According to this trend, the demand for high-quality point clouds is increasing, but there is still a problem with the high cost of obtaining high-quality point clouds. Therefore, with the recent...

Full description

Bibliographic Details
Main Authors: Hyungjun Lee, Sejoon Lim
Format: Article
Language:English
Published: MDPI AG 2022-11-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/22/23/9308