Development of a Generalized Photothermal Measurement Model for the Layer Thickness Determination of Multi-Layered Coating Systems
In this article, a general model for 1D thermal wave interference is derived for multi-layered coating systems (with <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi>n</mi><mo>∈</mo...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-03-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/13/7/4185 |