Testing the limits of the global instability index

The global instability index (GII) is a computationally inexpensive bond valence-based metric originally designed to evaluate the total bond strain in a crystal. Recently, the GII has gained popularity as a feature of data-driven models in materials research. Although prior studies have proven that...

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Bibliographic Details
Main Authors: Kyle D. Miller, James M. Rondinelli
Format: Article
Language:English
Published: AIP Publishing LLC 2023-10-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/5.0140480