Inductive Imaging of the Concealed Defects with Radio-Frequency Atomic Magnetometers
We explore the capabilities of the radio-frequency atomic magnetometers in the non-destructive detection of concealed defects. We present results from the systematic magnetic inductive measurement of various defect types in an electrically conductive object at different rf field frequencies (0.4–12...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-09-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/10/19/6871 |