RESEARCH OF VOLTAMPER CHARACTERISTICS OF SEMICONDUCTOR STRUCTURES AND DEVICES
Background. The object of study is an automated measuring system designed to measure the electrical parameters of semiconductor structures and devices. The subject of the study is the current-voltage characteristics of semiconductor structures and devices. The purpose of the work is to study the c...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Penza State University Publishing House
2024-10-01
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| Series: | Измерение, мониторинг, управление, контроль |
| Subjects: |