Automated Memory Corruption Detection through Analysis of Static Variables and Dynamic Memory Usage

Various methods for memory fault detection have been developed through continuous study. However, many memory defects remain that are difficult to resolve. Memory corruption is one such defect, and can cause system crashes, making debugging important. However, the locations of the system crash and t...

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Bibliographic Details
Main Authors: Jihyun Park, Byoungju Choi, Yeonhee Kim
Format: Article
Language:English
Published: MDPI AG 2021-09-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/10/17/2127