Simplistic Attachment and Multispectral Imaging with Semiconductor Nanocrystals
Advances in spectral deconvolution technologies are rapidly enabling researchers to replace or enhance traditional epifluorescence microscopes with instruments capable of detecting numerous markers simultaneously in a multiplexed fashion. While significantly expediting sample throughput and elucidat...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2011-11-01
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Series: | Sensors |
Subjects: | |
Online Access: | http://www.mdpi.com/1424-8220/11/11/10557/ |