Simplistic Attachment and Multispectral Imaging with Semiconductor Nanocrystals

Advances in spectral deconvolution technologies are rapidly enabling researchers to replace or enhance traditional epifluorescence microscopes with instruments capable of detecting numerous markers simultaneously in a multiplexed fashion. While significantly expediting sample throughput and elucidat...

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Bibliographic Details
Main Authors: Sara G. Becker-Catania, Zachary E. St. Louis, Guoliang Tao, Robert C. Triulzi, Travis L. Jennings
Format: Article
Language:English
Published: MDPI AG 2011-11-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/11/11/10557/

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