Various anti-fuse structures for field programmable gate arrays and programmable read-only memories

The use of anti-fuses as programmable elements is becoming popular in field programmable gate arrays and programmable read-only memories. The characteristics of various structures of anti-fuses and compromise between performance and reliability will be discussed in this paper.

Bibliographic Details
Main Authors: V. A. Petrovich, V. P. Bondarenko, A. L. Dolgiy, S. V. Redko
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
Online Access:https://doklady.bsuir.by/jour/article/view/1009