Various anti-fuse structures for field programmable gate arrays and programmable read-only memories
The use of anti-fuses as programmable elements is becoming popular in field programmable gate arrays and programmable read-only memories. The characteristics of various structures of anti-fuses and compromise between performance and reliability will be discussed in this paper.
Main Authors: | V. A. Petrovich, V. P. Bondarenko, A. L. Dolgiy, S. V. Redko |
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Format: | Article |
Language: | Russian |
Published: |
Educational institution «Belarusian State University of Informatics and Radioelectronics»
2019-06-01
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Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
Subjects: | |
Online Access: | https://doklady.bsuir.by/jour/article/view/1009 |
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