Non‐Zero and Open‐Loop Current–Voltage Characteristics in Electronic Memory Devices
Abstract This work focuses on the non‐zero‐crossing and open‐loop current–voltage (I–V) characteristics of electronic memory devices that are studied and focused on primarily for non‐volatile memory storage applications. Gold nanoparticles‐based devices are fabricated to understand possible non‐cros...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2023-10-01
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| Series: | Advanced Electronic Materials |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/aelm.202300324 |