Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films
<p class="ArticleAnnotation">A method for measuring the electrical conductivity and photoconductivity of semiconductor films with high electrical resistance is described. An electric circuit is presented and a computer program is developed. That provides automation of measurements, r...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Vasyl Stefanyk Precarpathian National University
2019-01-01
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| Series: | Фізика і хімія твердого тіла |
| Online Access: | http://journals.pu.if.ua/index.php/pcss/article/view/3394 |