Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films
<p class="ArticleAnnotation">A method for measuring the electrical conductivity and photoconductivity of semiconductor films with high electrical resistance is described. An electric circuit is presented and a computer program is developed. That provides automation of measurements, r...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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Vasyl Stefanyk Precarpathian National University
2019-01-01
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| Series: | Фізика і хімія твердого тіла |
| Online Access: | http://journals.pu.if.ua/index.php/pcss/article/view/3394 |
| _version_ | 1811289081787711488 |
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| author | B. S. Dzundza V. V. Prokopiv T. M. Mazur L. D. Yurchyshyn |
| author_facet | B. S. Dzundza V. V. Prokopiv T. M. Mazur L. D. Yurchyshyn |
| author_sort | B. S. Dzundza |
| collection | DOAJ |
| description | <p class="ArticleAnnotation">A method for measuring the electrical conductivity and photoconductivity of semiconductor films with high electrical resistance is described. An electric circuit is presented and a computer program is developed. That provides automation of measurements, registration and initial processing of data, the possibility of constructing timelines graphs for preliminary analysis of experimental data already in the process of measurement.</p> <p class="ArticleAnnotation"><strong>Key words:</strong> electrical parameters, photoconductivity, automation, microcontroller.</p> |
| first_indexed | 2024-04-13T03:48:40Z |
| format | Article |
| id | doaj.art-1089f501a1a640deafa9c4d2a9585d0f |
| institution | Directory Open Access Journal |
| issn | 1729-4428 2309-8589 |
| language | English |
| last_indexed | 2024-04-13T03:48:40Z |
| publishDate | 2019-01-01 |
| publisher | Vasyl Stefanyk Precarpathian National University |
| record_format | Article |
| series | Фізика і хімія твердого тіла |
| spelling | doaj.art-1089f501a1a640deafa9c4d2a9585d0f2022-12-22T03:03:54ZengVasyl Stefanyk Precarpathian National UniversityФізика і хімія твердого тіла1729-44282309-85892019-01-0119436336710.15330/pcss.19.4.363-3672874Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor FilmsB. S. Dzundza0V. V. Prokopiv1T. M. Mazur2L. D. Yurchyshyn3Фізико-хімічний інститут ДВНЗ «Прикарпатський національний університет імені Василя Стефаника»Фізико-хімічний інститут ДВНЗ «Прикарпатський національний університет імені Василя Стефаника»Фізико-хімічний інститут ДВНЗ «Прикарпатський національний університет імені Василя Стефаника»Фізико-хімічний інститут ДВНЗ «Прикарпатський національний університет імені Василя Стефаника»<p class="ArticleAnnotation">A method for measuring the electrical conductivity and photoconductivity of semiconductor films with high electrical resistance is described. An electric circuit is presented and a computer program is developed. That provides automation of measurements, registration and initial processing of data, the possibility of constructing timelines graphs for preliminary analysis of experimental data already in the process of measurement.</p> <p class="ArticleAnnotation"><strong>Key words:</strong> electrical parameters, photoconductivity, automation, microcontroller.</p>http://journals.pu.if.ua/index.php/pcss/article/view/3394 |
| spellingShingle | B. S. Dzundza V. V. Prokopiv T. M. Mazur L. D. Yurchyshyn Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films Фізика і хімія твердого тіла |
| title | Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films |
| title_full | Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films |
| title_fullStr | Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films |
| title_full_unstemmed | Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films |
| title_short | Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films |
| title_sort | automatization of measurements of photoelectric parameters of high impedance semiconductor films |
| url | http://journals.pu.if.ua/index.php/pcss/article/view/3394 |
| work_keys_str_mv | AT bsdzundza automatizationofmeasurementsofphotoelectricparametersofhighimpedancesemiconductorfilms AT vvprokopiv automatizationofmeasurementsofphotoelectricparametersofhighimpedancesemiconductorfilms AT tmmazur automatizationofmeasurementsofphotoelectricparametersofhighimpedancesemiconductorfilms AT ldyurchyshyn automatizationofmeasurementsofphotoelectricparametersofhighimpedancesemiconductorfilms |