A novel fault diagnosis method for PV arrays using convolutional extension neural network with symmetrized dot pattern analysis
Abstract PV fault diagnosis remains difficult due to the non‐linear characteristic of PV output, which makes PV output to be likely disturbed by the ambient environment. This study proposes a novel convolutional extension neural network (CENN) algorithm, which is a jointed architecture based on conv...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
Wiley
2024-03-01
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Series: | IET Science, Measurement & Technology |
Subjects: | |
Online Access: | https://doi.org/10.1049/smt2.12166 |