A novel fault diagnosis method for PV arrays using convolutional extension neural network with symmetrized dot pattern analysis

Abstract PV fault diagnosis remains difficult due to the non‐linear characteristic of PV output, which makes PV output to be likely disturbed by the ambient environment. This study proposes a novel convolutional extension neural network (CENN) algorithm, which is a jointed architecture based on conv...

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Bibliographic Details
Main Authors: Shiue‐Der Lu, Chia‐Chun Wu, Hong‐Wei Sian
Format: Article
Language:English
Published: Wiley 2024-03-01
Series:IET Science, Measurement & Technology
Subjects:
Online Access:https://doi.org/10.1049/smt2.12166