Quantitative modeling of perovskite-based direct X-ray flat panel detectors
Abstract Direct X-ray detectors based on semiconductors have drawn great attention from researchers in the pursuing of higher imaging quality. However, many previous works focused on the optimization of detection performances but seldomly watch them in an overall view and analyze how they will influ...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Springer & Higher Education Press
2024-09-01
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| Series: | Frontiers of Optoelectronics |
| Subjects: | |
| Online Access: | https://doi.org/10.1007/s12200-024-00136-0 |