Contact resonance frequencies and their harmonics in scanning probe microscopy

Contact resonance frequencies and their harmonics in scanning probe microscopy

Abstract Local characterizations of electric, magnetic, mechanical, electrochemical, and structural properties of materials by scanning probe microscopy (SPM) can be carried out by sensing variations of the contact cantilever's resonance frequencies, resulting in diverse microscopy techniques s...

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Bibliographic Details
Main Authors: Eduardo A. Murillo‐Bracamontes, Juan J. Gervacio‐Arciniega, Edgar Cruz‐Valeriano, Christian I. Enríquez‐Flores, Martha A. Palomino‐Ovando, José M. Yañez‐Limón, Jesús M. Siqueiros, M. Paz Cruz
Format: Article
Language:English
Published: Wiley 2021-07-01
Series:IET Science, Measurement & Technology
Subjects:
Scanning probe microscopy and related techniques
Structure of solid clusters, nanoparticles, nanotubes and nanostructured materials
Elasticity, elastic constants
Solid surface structure
Piezoelectricity and electrostriction
Ferroelectricity and antiferroelectricity
Online Access:https://doi.org/10.1049/smt2.12042

Internet

https://doi.org/10.1049/smt2.12042

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