Domain-RIP Analysis: A Technique for Analyzing Mutation Stubbornness
Existing mutation techniques generate vast numbers of equivalent and trivial mutants, which do not contribute on the improvement of test quality. One possible solution, as is proposed in this paper, is to measure the difficulty of killing a mutant and choose the stubborn (hard-to-kill) mutants in te...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8552345/ |