Application of High-resolution Scanning Electron Microscope and X-ray Energy Dispersive Spectroscope Mapping Technique to Study the Composition and Morphology of Tellurium Minerals

Application of High-resolution Scanning Electron Microscope and X-ray Energy Dispersive Spectroscope Mapping Technique to Study the Composition and Morphology of Tellurium Minerals

The X-ray Energy Dispersive Spectrometry EDS-Mapping technique can be used to directly observe distribution characteristic of elements in rock sections. The distribution characteristics and elemental assemblage of tellurium(Te) and some other elements(Au and Ag) from the Guilaizhuang gold field in S...

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Bibliographic Details
Main Authors: HU Yong-ping, YU Xue-feng, ZHENG Lin-wei, ZHENG Yi-fan
Format: Article
Language:English
Published: Science Press, PR China 2015-11-01
Series:Yankuang ceshi
Subjects:
telluride
morphological characteristics
scanning electron microscope
x-ray energy dispersive spectroscope(eds) mapping technique
Online Access:http://www.ykcs.ac.cn/en/article/doi/10.15898/j.cnki.11-2131/td.2015.06.007

Internet

http://www.ykcs.ac.cn/en/article/doi/10.15898/j.cnki.11-2131/td.2015.06.007

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