Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL

Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL

Characterizing the properties of X-ray free-electron laser (XFEL) sources is a critical step for optimization of performance and experiment planning. The recent availability of MHz XFELs has opened up a range of new opportunities for novel experiments but also highlighted the need for systematic mea...

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Bibliographic Details
Main Authors: Trey W. Guest, Richard Bean, Johan Bielecki, Sarlota Birnsteinova, Gianluca Geloni, Marc Guetg, Raimund Kammering, Henry J. Kirkwood, Andreas Koch, David M. Paganin, Grant van Riessen, Patrik Vagovič, Raphael de Wijn, Adrian P. Mancuso, Brian Abbey
Format: Article
Language:English
Published: International Union of Crystallography 2022-07-01
Series:Journal of Synchrotron Radiation
Subjects:
x-ray free-electron lasers
photon diagnostics
source characterization
european xfel
mhz xfel
xfel radiation
beam imaging
Online Access:http://scripts.iucr.org/cgi-bin/paper?S1600577522005720

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http://scripts.iucr.org/cgi-bin/paper?S1600577522005720

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