Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL
Characterizing the properties of X-ray free-electron laser (XFEL) sources is a critical step for optimization of performance and experiment planning. The recent availability of MHz XFELs has opened up a range of new opportunities for novel experiments but also highlighted the need for systematic mea...
| Main Authors: | , , , , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
International Union of Crystallography
2022-07-01
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| Series: | Journal of Synchrotron Radiation |
| Subjects: | |
| Online Access: | http://scripts.iucr.org/cgi-bin/paper?S1600577522005720 |
| _version_ | 1828338799648702464 |
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| author | Trey W. Guest Richard Bean Johan Bielecki Sarlota Birnsteinova Gianluca Geloni Marc Guetg Raimund Kammering Henry J. Kirkwood Andreas Koch David M. Paganin Grant van Riessen Patrik Vagovič Raphael de Wijn Adrian P. Mancuso Brian Abbey |
| author_facet | Trey W. Guest Richard Bean Johan Bielecki Sarlota Birnsteinova Gianluca Geloni Marc Guetg Raimund Kammering Henry J. Kirkwood Andreas Koch David M. Paganin Grant van Riessen Patrik Vagovič Raphael de Wijn Adrian P. Mancuso Brian Abbey |
| author_sort | Trey W. Guest |
| collection | DOAJ |
| description | Characterizing the properties of X-ray free-electron laser (XFEL) sources is a critical step for optimization of performance and experiment planning. The recent availability of MHz XFELs has opened up a range of new opportunities for novel experiments but also highlighted the need for systematic measurements of the source properties. Here, MHz-enabled beam imaging diagnostics developed for the SPB/SFX instrument at the European XFEL are exploited to measure the shot-to-shot intensity statistics of X-ray pulses. The ability to record pulse-integrated two-dimensional transverse intensity measurements at multiple planes along an XFEL beamline at MHz rates yields an improved understanding of the shot-to-shot photon beam intensity variations. These variations can play a critical role, for example, in determining the outcome of single-particle imaging experiments and other experiments that are sensitive to the transverse profile of the incident beam. It is observed that shot-to-shot variations in the statistical properties of a recorded ensemble of radiant intensity distributions are sensitive to changes in electron beam current density. These changes typically occur during pulse-distribution to the instrument and are currently not accounted for by the existing suite of imaging diagnostics. Modulations of the electron beam orbit in the accelerator are observed to induce a time-dependence in the statistics of individual pulses – this is demonstrated by applying radio-frequency trajectory tilts to electron bunch-trains delivered to the instrument. We discuss how these modifications of the beam trajectory might be used to modify the statistical properties of the source and potential future applications. |
| first_indexed | 2024-04-13T22:34:01Z |
| format | Article |
| id | doaj.art-117c3a33c3644ca385b2ecafb42294b5 |
| institution | Directory Open Access Journal |
| issn | 1600-5775 |
| language | English |
| last_indexed | 2024-04-13T22:34:01Z |
| publishDate | 2022-07-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj.art-117c3a33c3644ca385b2ecafb42294b52022-12-22T02:26:49ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752022-07-0129493994610.1107/S1600577522005720yi5126Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFELTrey W. Guest0Richard Bean1Johan Bielecki2Sarlota Birnsteinova3Gianluca Geloni4Marc Guetg5Raimund Kammering6Henry J. Kirkwood7Andreas Koch8David M. Paganin9Grant van Riessen10Patrik Vagovič11Raphael de Wijn12Adrian P. Mancuso13Brian Abbey14La Trobe Institute for Molecular Science, La Trobe University, Bundoora, VIC 3086, AustraliaEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyDeutsches Elektronen-Synchrotron, Notkestrasse 85, 22607 Hamburg, GermanyDeutsches Elektronen-Synchrotron, Notkestrasse 85, 22607 Hamburg, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanySchool of Physics and Astronomy, Monash University, VIC 3800, AustraliaLa Trobe Institute for Molecular Science, La Trobe University, Bundoora, VIC 3086, AustraliaEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyEuropean XFEL, Holzkoppel 4, 22869 Schenefeld, GermanyLa Trobe Institute for Molecular Science, La Trobe University, Bundoora, VIC 3086, AustraliaLa Trobe Institute for Molecular Science, La Trobe University, Bundoora, VIC 3086, AustraliaCharacterizing the properties of X-ray free-electron laser (XFEL) sources is a critical step for optimization of performance and experiment planning. The recent availability of MHz XFELs has opened up a range of new opportunities for novel experiments but also highlighted the need for systematic measurements of the source properties. Here, MHz-enabled beam imaging diagnostics developed for the SPB/SFX instrument at the European XFEL are exploited to measure the shot-to-shot intensity statistics of X-ray pulses. The ability to record pulse-integrated two-dimensional transverse intensity measurements at multiple planes along an XFEL beamline at MHz rates yields an improved understanding of the shot-to-shot photon beam intensity variations. These variations can play a critical role, for example, in determining the outcome of single-particle imaging experiments and other experiments that are sensitive to the transverse profile of the incident beam. It is observed that shot-to-shot variations in the statistical properties of a recorded ensemble of radiant intensity distributions are sensitive to changes in electron beam current density. These changes typically occur during pulse-distribution to the instrument and are currently not accounted for by the existing suite of imaging diagnostics. Modulations of the electron beam orbit in the accelerator are observed to induce a time-dependence in the statistics of individual pulses – this is demonstrated by applying radio-frequency trajectory tilts to electron bunch-trains delivered to the instrument. We discuss how these modifications of the beam trajectory might be used to modify the statistical properties of the source and potential future applications.http://scripts.iucr.org/cgi-bin/paper?S1600577522005720x-ray free-electron lasersphoton diagnosticssource characterizationeuropean xfelmhz xfelxfel radiationbeam imaging |
| spellingShingle | Trey W. Guest Richard Bean Johan Bielecki Sarlota Birnsteinova Gianluca Geloni Marc Guetg Raimund Kammering Henry J. Kirkwood Andreas Koch David M. Paganin Grant van Riessen Patrik Vagovič Raphael de Wijn Adrian P. Mancuso Brian Abbey Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL Journal of Synchrotron Radiation x-ray free-electron lasers photon diagnostics source characterization european xfel mhz xfel xfel radiation beam imaging |
| title | Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL |
| title_full | Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL |
| title_fullStr | Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL |
| title_full_unstemmed | Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL |
| title_short | Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL |
| title_sort | shot to shot two dimensional photon intensity diagnostics within megahertz pulse trains at the european xfel |
| topic | x-ray free-electron lasers photon diagnostics source characterization european xfel mhz xfel xfel radiation beam imaging |
| url | http://scripts.iucr.org/cgi-bin/paper?S1600577522005720 |
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