Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements

Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements

While it has recently been demonstrated how to certify the maximal amount of randomness from any pure two-qubit entangled state in a device-independent way, the problem of optimal randomness certification from entangled states of higher local dimension remains open. Here we introduce a method for de...

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Bibliographic Details
Main Authors: Jakub J. Borkała, Chellasamy Jebarathinam, Shubhayan Sarkar, Remigiusz Augusiak
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Entropy
Subjects:
randomness certification
self-testing
extremal POVM
Weyl–Heisenberg basis
Online Access:https://www.mdpi.com/1099-4300/24/3/350

Internet

https://www.mdpi.com/1099-4300/24/3/350

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