Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements

While it has recently been demonstrated how to certify the maximal amount of randomness from any pure two-qubit entangled state in a device-independent way, the problem of optimal randomness certification from entangled states of higher local dimension remains open. Here we introduce a method for de...

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Main Authors: Jakub J. Borkała, Chellasamy Jebarathinam, Shubhayan Sarkar, Remigiusz Augusiak
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Entropy
Subjects:
Online Access:https://www.mdpi.com/1099-4300/24/3/350
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author Jakub J. Borkała
Chellasamy Jebarathinam
Shubhayan Sarkar
Remigiusz Augusiak
author_facet Jakub J. Borkała
Chellasamy Jebarathinam
Shubhayan Sarkar
Remigiusz Augusiak
author_sort Jakub J. Borkała
collection DOAJ
description While it has recently been demonstrated how to certify the maximal amount of randomness from any pure two-qubit entangled state in a device-independent way, the problem of optimal randomness certification from entangled states of higher local dimension remains open. Here we introduce a method for device-independent certification of the maximal possible amount of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>2</mn><msub><mo form="prefix">log</mo><mn>2</mn></msub><mn>3</mn></mrow></semantics></math></inline-formula> random bits using pure bipartite entangled two-qutrit states and extremal nine-outcome general non-projective measurements. To this aim, we exploit a device-independent method for certification of the full Weyl–Heisenberg basis in three-dimensional Hilbert spaces together with a one-sided device-independent method for certification of two-qutrit partially entangled states.
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spelling doaj.art-118b7ed861cd444293b79cd4301d93222023-11-24T01:07:08ZengMDPI AGEntropy1099-43002022-02-0124335010.3390/e24030350Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective MeasurementsJakub J. Borkała0Chellasamy Jebarathinam1Shubhayan Sarkar2Remigiusz Augusiak3Center for Theoretical Physics, Polish Academy of Sciences, Aleja Lotników 32/46, 02-668 Warsaw, PolandCenter for Theoretical Physics, Polish Academy of Sciences, Aleja Lotników 32/46, 02-668 Warsaw, PolandCenter for Theoretical Physics, Polish Academy of Sciences, Aleja Lotników 32/46, 02-668 Warsaw, PolandCenter for Theoretical Physics, Polish Academy of Sciences, Aleja Lotników 32/46, 02-668 Warsaw, PolandWhile it has recently been demonstrated how to certify the maximal amount of randomness from any pure two-qubit entangled state in a device-independent way, the problem of optimal randomness certification from entangled states of higher local dimension remains open. Here we introduce a method for device-independent certification of the maximal possible amount of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>2</mn><msub><mo form="prefix">log</mo><mn>2</mn></msub><mn>3</mn></mrow></semantics></math></inline-formula> random bits using pure bipartite entangled two-qutrit states and extremal nine-outcome general non-projective measurements. To this aim, we exploit a device-independent method for certification of the full Weyl–Heisenberg basis in three-dimensional Hilbert spaces together with a one-sided device-independent method for certification of two-qutrit partially entangled states.https://www.mdpi.com/1099-4300/24/3/350randomness certificationself-testingextremal POVMWeyl–Heisenberg basis
spellingShingle Jakub J. Borkała
Chellasamy Jebarathinam
Shubhayan Sarkar
Remigiusz Augusiak
Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements
Entropy
randomness certification
self-testing
extremal POVM
Weyl–Heisenberg basis
title Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements
title_full Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements
title_fullStr Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements
title_full_unstemmed Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements
title_short Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements
title_sort device independent certification of maximal randomness from pure entangled two qutrit states using non projective measurements
topic randomness certification
self-testing
extremal POVM
Weyl–Heisenberg basis
url https://www.mdpi.com/1099-4300/24/3/350
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AT chellasamyjebarathinam deviceindependentcertificationofmaximalrandomnessfrompureentangledtwoqutritstatesusingnonprojectivemeasurements
AT shubhayansarkar deviceindependentcertificationofmaximalrandomnessfrompureentangledtwoqutritstatesusingnonprojectivemeasurements
AT remigiuszaugusiak deviceindependentcertificationofmaximalrandomnessfrompureentangledtwoqutritstatesusingnonprojectivemeasurements