Emissivity Correction and Thermal Pattern Reconstruction in Eddy Current Pulsed Thermography

Emissivity Correction and Thermal Pattern Reconstruction in Eddy Current Pulsed Thermography

Emissivity variations are one of the most critical challenges in thermography technologies; this is due to the temperature calculation strongly depending on emissivity settings for infrared signal extraction and evaluation. This paper describes an emissivity correction and thermal pattern reconstruc...

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Bibliographic Details
Main Authors: Kongjing Li, Gui Yun Tian, Junaid Ahmed
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Sensors
Subjects:
thermography
emissivity correction
thermal pattern reconstruction
intelligent fault diagnosis
Online Access:https://www.mdpi.com/1424-8220/23/5/2646

Internet

https://www.mdpi.com/1424-8220/23/5/2646

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