Research of “one key sequence control” test method based on panoramic digital simulation technology

Aiming at the problem that the current “one key sequence control” system cannot effectively carry out the test work after being deployed in a substation project, a “one key sequential control” test method based on panoramic digital simulation technology is proposed. The actual primary and secondary...

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Bibliographic Details
Main Authors: Yongxin Chen, Hengxuan Li, Xiaohui Li, Kanjun Zhang, Jiajia Hu, Du Liu
Format: Article
Language:English
Published: AIP Publishing LLC 2022-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0135202