A Study of Residual Image in Charged-Coupled Device
For an image sensor CCD, electrons can be trapped at the front-side Si-SiO_2 surface interface in a case of exceeding the full well by bright source. Residual images can be made by the electrons remaining in the interface. These residual images are seen in the front-side-illuminated CCDs especially....
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
The Korean Space Science Society
2005-12-01
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| Series: | Journal of Astronomy and Space Sciences |
| Subjects: | |
| Online Access: | http://ocean.kisti.re.kr/downfile/volume/kosss/OJOOBS/2005/v22n4/OJOOBS_2005_v22n4_483.pdf |