Self‐supervised learning improves classification of agriculturally important insect pests in plants

Abstract Insect pests cause significant damage to food production, so early detection and efficient mitigation strategies are crucial. There is a continual shift toward machine learning (ML)‐based approaches for automating agricultural pest detection. Although supervised learning has achieved remark...

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Bibliographic Details
Main Authors: Soumyashree Kar, Koushik Nagasubramanian, Dinakaran Elango, Matthew E. Carroll, Craig A. Abel, Ajay Nair, Daren S. Mueller, Matthew E. O'Neal, Asheesh K. Singh, Soumik Sarkar, Baskar Ganapathysubramanian, Arti Singh
Format: Article
Language:English
Published: Wiley 2023-12-01
Series:Plant Phenome Journal
Online Access:https://doi.org/10.1002/ppj2.20079