Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes

Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes

The potential of wide-field magneto-optical Kerr microscopy for the characterisation of low-dimensional van-der-Waals crystals is explored using the example of Cr₂Ge₂Te₆ flakes in the ten nanometers thickness range. Although the magnetic domains with an expected widt...

Full description

Bibliographic Details
Main Authors: Ivan Soldatov, Burak Ozer, Saicharan Aswartham, Sebastian Selter, Louis Veyrat, Bernd Buchner, Rudolf Schafer
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Access
Subjects:
Magnetic domains
magnetic hysteresis
magneto-optical Kerr microscopy
MOKE magnetometry
2D magnetic materials
van der Waals materials
Online Access:https://ieeexplore.ieee.org/document/10771764/

Internet

https://ieeexplore.ieee.org/document/10771764/

Similar Items