High crystallinity N-polar InGaN layers grown on cleaved ScAlMgO4 substrates

We have grown high-crystallinity InGaN layers on ScAlMgO4 (SAM) substrates using metalorganic vapor-phase epitaxy. We have prepared atomically flat SAM substrates by cleaving them along the c-plane and have utilized direct InGaN growth without any low-temperature buffer layer. The resulting InGaN la...

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Bibliographic Details
Main Authors: Pavel Kirilenko, Mohammed A. Najmi, Bei Ma, Artem Shushanian, Martin Velazquez-Rizo, Daisuke Iida, Kazuhiro Ohkawa
Format: Article
Language:English
Published: AIP Publishing LLC 2023-04-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0136205