Remarkable Reduction in I<sub>G</sub> with an Explicit Investigation of the Leakage Conduction Mechanisms in a Dual Surface-Modified Al<sub>2</sub>O<sub>3</sub>/SiO<sub>2</sub> Stack Layer AlGaN/GaN MOS-HEMT
We demonstrated the performance of an Al<sub>2</sub>O<sub>3</sub>/SiO<sub>2</sub> stack layer AlGaN/GaN metal–oxide semiconductor (MOS) high-electron-mobility transistor (HEMT) combined with a dual surface treatment that used tetramethylammonium hydroxide (TMAH) a...
Main Authors: | Soumen Mazumder, Parthasarathi Pal, Kuan-Wei Lee, Yeong-Her Wang |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-12-01
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Series: | Materials |
Subjects: | |
Online Access: | https://www.mdpi.com/1996-1944/15/24/9067 |
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