Reliability analysis for vertical integration of protection, measurement, merge unit, and intelligent terminal device

The reliability analysis of vertically integrated protection devices is crucial for designing International Electrotechnical Commission (IEC) 61850-based substations. This paper presents the hardware architecture of a four-in- one vertically integrated device and the information transmission path of...

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Bibliographic Details
Main Authors: Ying Li, Weiquan Wang, Liang Zhang, Zhujian Liang, Zhenli Xu, Yuansheng Liang
Format: Article
Language:English
Published: KeAi Communications Co., Ltd. 2023-12-01
Series:Global Energy Interconnection
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2096511723001019