Transfer Learning based Low Shot Classifier for Software Defect Prediction

Background: The rapid growth and increasing complexity of software applications are causing challenges in maintaining software quality within constraints of time and resources. This challenge led to the emergence of a new field of study known as Software Defect Prediction (SDP), which focuses on pre...

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Bibliographic Details
Main Authors: Vikas Suhag, Sanjay Kumar Dubey, Bhupendra Kumar Sharma
Format: Article
Language:English
Published: Universitas Airlangga 2023-11-01
Series:Journal of Information Systems Engineering and Business Intelligence
Online Access:https://e-journal.unair.ac.id/JISEBI/article/view/46727