Development of data acquisition system for prototype of SHINE wire scanner system
BackgroundThe Shanghai high repetition rate XFEL and extreme light facility (SHINE) accelerates electrons up to 8 GeV using cryogenic-superconducting high-frequency cavity. Wire scanner system is applied to the beam profile measurement of SHINE due to its advantages such as fewer secondary particles...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | zho |
| Published: |
Science Press
2022-05-01
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| Series: | He jishu |
| Subjects: | |
| Online Access: | https://www.hjs.sinap.ac.cn/thesisDetails#10.11889/j.0253-3219.2022.hjs.45.050101&lang=zh |