Influence of the Electron Beam and the Choice of Heating Membrane on the Evolution of Si Nanowires’ Morphology in In Situ TEM

Influence of the Electron Beam and the Choice of Heating Membrane on the Evolution of Si Nanowires’ Morphology in In Situ TEM

We used in situ transmission electron microscopy (TEM) to observe the dynamic changes of Si nanowires under electron beam irradiation. We found evidence of structural evolutions under TEM observation due to a combination of electron beam and thermal effects. Two types of heating holders were used: a...

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Bibliographic Details
Main Authors: Ya Shen, Xuechun Zhao, Ruiling Gong, Eric Ngo, Jean-Luc Maurice, Pere Roca i Cabarrocas, Wanghua Chen
Format: Article
Language:English
Published: MDPI AG 2022-07-01
Series:Materials
Subjects:
electron beam irradiation
silicon nanowire
growth
TEM
Online Access:https://www.mdpi.com/1996-1944/15/15/5244

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https://www.mdpi.com/1996-1944/15/15/5244

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