Damage Behavior with Atomic Force Microscopy on Anti-Bacterial Nanostructure Arrays

Damage Behavior with Atomic Force Microscopy on Anti-Bacterial Nanostructure Arrays

The atomic force microscope is a versatile tool for assessing the topography, friction, and roughness of a broad spectrum of surfaces, encompassing anti-bacterial nanostructure arrays. Measuring and comparing all these values with one instrument allows clear comparisons of many nanomechanical reacti...

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Bibliografische gegevens
Hoofdauteurs: Jonathan Wood, Richard Bright, Dennis Palms, Dan Barker, Krasimir Vasilev
Formaat: Artikel
Taal:English
Gepubliceerd in: MDPI AG 2024-01-01
Reeks:Nanomaterials
Onderwerpen:
atomic force microscopy
AFM
LFM
deformation
hydrothermally etched
nanostructures
Online toegang:https://www.mdpi.com/2079-4991/14/3/253

Internet

https://www.mdpi.com/2079-4991/14/3/253

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