Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data

Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data

The insulated gate bipolar transistor (IGBT) is a kind of excellent performance switching device used widely in power electronic systems. How to estimate the remaining useful life (RUL) of an IGBT to ensure the safety and reliability of the power electronics system is currently a challenging issue i...

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Bibliographic Details
Main Authors: Zhen Liu, Wenjuan Mei, Xianping Zeng, Chenglin Yang, Xiuyun Zhou
Format: Article
Language:English
Published: MDPI AG 2017-11-01
Series:Sensors
Subjects:
remaining useful life
IGBT
prediction model
VKOPP
degradation data
Online Access:https://www.mdpi.com/1424-8220/17/11/2524

Internet

https://www.mdpi.com/1424-8220/17/11/2524

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