Measuring external primary cell wall elasticity of seedling roots using atomic force microscopy

Summary: Stiffness plays a central action in plant cell extension. Here, we present a protocol to detect changes in stiffness on the external epidermal cell wall of living plant roots using atomic force microscopy (AFM). We provide generalized instructions for collecting force-distance curves and an...

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Bibliographic Details
Main Authors: Harinderbir Kaur, Jean-Marie Teulon, Anne-Emmanuelle Foucher, Daphna Fenel, Shu-wen W. Chen, Christian Godon, Thierry Desnos, Jean-Luc Pellequer
Format: Article
Language:English
Published: Elsevier 2023-06-01
Series:STAR Protocols
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Online Access:http://www.sciencedirect.com/science/article/pii/S266616672300223X