An assessment of applicability of the two-dimensional wavelet transform to assess the minimum chip thickness determination accuracy
The objective of the study was to assess the potential use of optical measuring instruments to determine the minimum chip thickness in face milling. Images of scanned surfaces were analyzed using mother wavelets. Filtration of optical signals helped identify the characteristic zones observed on the...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Polish Academy of Sciences
2021-01-01
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| Series: | Metrology and Measurement Systems |
| Subjects: | |
| Online Access: | https://journals.pan.pl/Content/117861/PDF/art08.pdf |