Robust Pareto Transistor Sizing of GaN HEMTs for Millimeter-Wave Applications

This paper introduces a robust Pareto design approach for transistor sizing of Gallium Nitride (GaN) High Electron Mobility Transistors (HEMTs), particularly for power amplifier (PA) and low-noise amplifier (LNA) designs in 5G applications. We consider five key design variables and two settings (PAs...

Full description

Bibliographic Details
Main Authors: Rafael Perez Martinez, Stephen Boyd, Srabanti Chowdhury
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10892100/