Quantitative dynamic force microscopy with inclined tip oscillation
In the mathematical description of dynamic atomic force microscopy (AFM), the relation between the tip–surface normal interaction force, the measurement observables, and the probe excitation parameters is defined by an average of the normal force along the sampling path over the oscillation cycle. U...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Beilstein-Institut
2022-07-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.13.53 |