Structural Assessment of Interfaces in Projected Phase-Change Memory

Structural Assessment of Interfaces in Projected Phase-Change Memory

Non-volatile memories based on phase-change materials have gained ground for applications in analog in-memory computing. Nonetheless, non-idealities inherent to the material result in device resistance variations that impair the achievable numerical precision. Projected-type phase-change memory devi...

Full description

Bibliographic Details
Main Authors: Valeria Bragaglia, Vara Prasad Jonnalagadda, Marilyne Sousa, Syed Ghazi Sarwat, Benedikt Kersting, Abu Sebastian
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Nanomaterials
Subjects:
in-memory computing
projected phase-change memory
interface engineering
confined phase-change material
sputtering deposition
X-ray reflectivity
Online Access:https://www.mdpi.com/2079-4991/12/10/1702

Internet

https://www.mdpi.com/2079-4991/12/10/1702

Similar Items