MEASUREMENT OF THICKNESSES OF OPTICALLY TRANSPARENT LAYERED STRUCTURES BY THE SPECTRAL INTERFEROMETRY METHOD
The results of applying the method of spectral interferometry in optical band for measuring the thicknesses of thin films are presented in this paper. We have analyzed analytically and experimentally the spectrum of the total radiation at the output of the fiber optic Fabry-Perot interferometer whic...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Akademperiodyka
2017-03-01
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| Series: | Радиофизика и электроника |
| Subjects: | |
| Online Access: | http://re-journal.org.ua/sites/default/files/file_attach/arh_fulltxt/12.pdf |