Thickness-dependent piezoelectric behaviour and dielectric properties of lanthanum modified BiFeO3 thin films

Thickness-dependent piezoelectric behaviour and dielectric properties of lanthanum modified BiFeO3 thin films

Bi0.85La0.15FeO3 (BLFO) thin films were deposited on Pt(111)/Ti/SiO2 /Si substrates by the soft chemical method. Films with thicknesses ranging from 140 to 280 nm were grown on platinum coated silicon substrates at 500°C for 2 hours. The X-ray diffraction analysis of BLFO films evidenced a hexagonal...

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Bibliographic Details
Main Authors: Glenda Biasotto, Francisco Moura, Cesar Foschini, Elson Longo, Jose A. Varela, Alexandre Z. Simões
Format: Article
Language:English
Published: University of Novi Sad 2011-03-01
Series:Processing and Application of Ceramics
Subjects:
Thin films
Oxides
Chemical syntheses
Piezoelectricity
Online Access:http://www.tf.uns.ac.rs/publikacije/PAC/pdf/PAC%2011%2005.pdf

Internet

http://www.tf.uns.ac.rs/publikacije/PAC/pdf/PAC%2011%2005.pdf

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