Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentials

Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentials

Background: The analysis and interpretation of transcranial magnetic stimulation (TMS)-evoked potentials (TEPs) relies on successful cleaning of the artifacts, which typically mask the early (0–30 ms) TEPs. Independent component analysis (ICA) is possibly the single most utilized methodology to clea...

Full description

Bibliographic Details
Main Authors: Iiris Atti, Paolo Belardinelli, Risto J. Ilmoniemi, Johanna Metsomaa
Format: Article
Language:English
Published: Elsevier 2024-01-01
Series:Brain Stimulation
Subjects:
Artifact
Electroencephalography
Event-related potentials
Independent component analysis
Transcranial magnetic stimulation
Online Access:http://www.sciencedirect.com/science/article/pii/S1935861X23019629

Internet

http://www.sciencedirect.com/science/article/pii/S1935861X23019629

Similar Items