Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentials

Background: The analysis and interpretation of transcranial magnetic stimulation (TMS)-evoked potentials (TEPs) relies on successful cleaning of the artifacts, which typically mask the early (0–30 ms) TEPs. Independent component analysis (ICA) is possibly the single most utilized methodology to clea...

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Main Authors: Iiris Atti, Paolo Belardinelli, Risto J. Ilmoniemi, Johanna Metsomaa
Format: Article
Language:English
Published: Elsevier 2024-01-01
Series:Brain Stimulation
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S1935861X23019629
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author Iiris Atti
Paolo Belardinelli
Risto J. Ilmoniemi
Johanna Metsomaa
author_facet Iiris Atti
Paolo Belardinelli
Risto J. Ilmoniemi
Johanna Metsomaa
author_sort Iiris Atti
collection DOAJ
description Background: The analysis and interpretation of transcranial magnetic stimulation (TMS)-evoked potentials (TEPs) relies on successful cleaning of the artifacts, which typically mask the early (0–30 ms) TEPs. Independent component analysis (ICA) is possibly the single most utilized methodology to clean these signals. Objective: ICA-based cleaning is reliable provided that the input data are composed of independent components. Differently, in case the underlying components are to some extent dependent, ICA algorithms may yield erroneous estimates of the components, resulting in incorrectly cleaned data. We aim to ascertain whether TEP signals are suited for ICA. Methods: We present a systematic analysis of how the properties of simulated artifacts imposed on measured artifact-free TEPs affect the ICA results. The variability of the artifact waveform over the recorded trials is varied from deterministic to stochastic. We measure the accuracy of ICA-based cleaning for each level of variability. Results: Our findings indicate that, when the trial-to-trial variability of an artifact component is small, which can result in dependencies between underlying components, ICA-based cleaning biases towards eliminating also non-artifactual TEP data. We also show that the variability can be measured using the ICA-derived components, which in turn allows us to estimate the cleaning accuracy. Conclusion: As TEP artifacts tend to have small trial-to-trial variability, one should be aware of the possibility of eliminating brain-derived EEG when applying ICA-based cleaning strategies. In practice, after ICA, the artifact component variability can be measured, and it predicts to some extent the cleaning reliability, even when not knowing the clean ground-truth data.
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spelling doaj.art-16c67c8e03694a17a99d48a739e50b9e2023-12-16T06:06:50ZengElsevierBrain Stimulation1935-861X2024-01-011711018Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentialsIiris Atti0Paolo Belardinelli1Risto J. Ilmoniemi2Johanna Metsomaa3Department of Neuroscience and Biomedical Engineering, Aalto University School of Science, FinlandCenter for Mind/Brain Sciences - CIMeC, University of Trento, Italy; Department of Neurology & Stroke, University of Tübingen, GermanyDepartment of Neuroscience and Biomedical Engineering, Aalto University School of Science, FinlandDepartment of Neuroscience and Biomedical Engineering, Aalto University School of Science, Finland; Corresponding author at: Department of Neuroscience and Biomedical Engineering, Aalto University School of Science, P.O. Box 12200, FI-00076 Aalto, Finland.Background: The analysis and interpretation of transcranial magnetic stimulation (TMS)-evoked potentials (TEPs) relies on successful cleaning of the artifacts, which typically mask the early (0–30 ms) TEPs. Independent component analysis (ICA) is possibly the single most utilized methodology to clean these signals. Objective: ICA-based cleaning is reliable provided that the input data are composed of independent components. Differently, in case the underlying components are to some extent dependent, ICA algorithms may yield erroneous estimates of the components, resulting in incorrectly cleaned data. We aim to ascertain whether TEP signals are suited for ICA. Methods: We present a systematic analysis of how the properties of simulated artifacts imposed on measured artifact-free TEPs affect the ICA results. The variability of the artifact waveform over the recorded trials is varied from deterministic to stochastic. We measure the accuracy of ICA-based cleaning for each level of variability. Results: Our findings indicate that, when the trial-to-trial variability of an artifact component is small, which can result in dependencies between underlying components, ICA-based cleaning biases towards eliminating also non-artifactual TEP data. We also show that the variability can be measured using the ICA-derived components, which in turn allows us to estimate the cleaning accuracy. Conclusion: As TEP artifacts tend to have small trial-to-trial variability, one should be aware of the possibility of eliminating brain-derived EEG when applying ICA-based cleaning strategies. In practice, after ICA, the artifact component variability can be measured, and it predicts to some extent the cleaning reliability, even when not knowing the clean ground-truth data.http://www.sciencedirect.com/science/article/pii/S1935861X23019629ArtifactElectroencephalographyEvent-related potentialsIndependent component analysisTranscranial magnetic stimulation
spellingShingle Iiris Atti
Paolo Belardinelli
Risto J. Ilmoniemi
Johanna Metsomaa
Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentials
Brain Stimulation
Artifact
Electroencephalography
Event-related potentials
Independent component analysis
Transcranial magnetic stimulation
title Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentials
title_full Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentials
title_fullStr Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentials
title_full_unstemmed Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentials
title_short Measuring the accuracy of ICA-based artifact removal from TMS-evoked potentials
title_sort measuring the accuracy of ica based artifact removal from tms evoked potentials
topic Artifact
Electroencephalography
Event-related potentials
Independent component analysis
Transcranial magnetic stimulation
url http://www.sciencedirect.com/science/article/pii/S1935861X23019629
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AT ristojilmoniemi measuringtheaccuracyoficabasedartifactremovalfromtmsevokedpotentials
AT johannametsomaa measuringtheaccuracyoficabasedartifactremovalfromtmsevokedpotentials