NanoSIMS Analysis of Rare Earth Elements in Silicate Glass and Zircon: Implications for Partition Coefficients

We have developed a method to analyze all rare earth elements in silicate glasses and zircon minerals using a high lateral resolution secondary ion mass spectrometer (NanoSIMS). A 2nA O− primary beam was used to sputter a 7–8-μm diameter crater on the sample surface, and secondary positive ions were...

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Bibliographic Details
Main Authors: Lanlan Shi, Yuji Sano, Naoto Takahata, Mizuho Koike, Takuya Morita, Yuta Koyama, Takanori Kagoshima, Yuan Li, Sheng Xu, Congqiang Liu
Format: Article
Language:English
Published: Frontiers Media S.A. 2022-03-01
Series:Frontiers in Chemistry
Subjects:
Online Access:https://www.frontiersin.org/articles/10.3389/fchem.2022.844953/full