In Situ Monitoring of Pulsed Laser Annealing of Eu-Doped Oxide Thin Films

In Situ Monitoring of Pulsed Laser Annealing of Eu-Doped Oxide Thin Films

Eu<sup>3+</sup>-doped oxide thin films possess a great potential for several emerging applications in optics, optoelectronics, and sensors. The applications demand maximizing Eu<sup>3+</sup> photoluminescence response. Eu-doped ZnO, TiO<sub>2,</sub> and Lu<sub&...

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Bibliographic Details
Main Authors: Michal Novotný, Jan Remsa, Šárka Havlová, Joris More-Chevalier, Stefan Andrei Irimiciuc, Sergii Chertopalov, Petr Písařík, Lenka Volfová, Přemysl Fitl, Tomáš Kmječ, Martin Vrňata, Ján Lančok
Format: Article
Language:English
Published: MDPI AG 2021-12-01
Series:Materials
Subjects:
pulsed laser deposition
pulsed laser annealing
zinc oxide
lutetium oxide
titanium oxide
europium
Online Access:https://www.mdpi.com/1996-1944/14/24/7576

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https://www.mdpi.com/1996-1944/14/24/7576

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