Implementation of threshold- and memory-switching memristors based on electrochemical metallization in an identical ferroelectric electrolyte

Abstract The use of an identical electrolyte in electrochemical metallization (ECM)-based neuron and synaptic devices has not yet been achieved due to their different resistive-switching characteristics. Herein, we describe ECM devices comprising the same ferroelectric PbZr0.52Ti0.48O3 (PZT) electro...

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Main Authors: Chansoo Yoon, Gwangtaek Oh, Sohwi Kim, Jihoon Jeon, Ji Hye Lee, Young Heon Kim, Bae Ho Park
Format: Article
Language:English
Published: Nature Portfolio 2023-05-01
Series:NPG Asia Materials
Online Access:https://doi.org/10.1038/s41427-023-00481-0
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author Chansoo Yoon
Gwangtaek Oh
Sohwi Kim
Jihoon Jeon
Ji Hye Lee
Young Heon Kim
Bae Ho Park
author_facet Chansoo Yoon
Gwangtaek Oh
Sohwi Kim
Jihoon Jeon
Ji Hye Lee
Young Heon Kim
Bae Ho Park
author_sort Chansoo Yoon
collection DOAJ
description Abstract The use of an identical electrolyte in electrochemical metallization (ECM)-based neuron and synaptic devices has not yet been achieved due to their different resistive-switching characteristics. Herein, we describe ECM devices comprising the same ferroelectric PbZr0.52Ti0.48O3 (PZT) electrolyte, which can sustain both neuron and synaptic behavior depending on the identity of the active electrode. The Ag/PZT/La0.8Sr0.2MnO3 (LSMO) threshold switching memristor shows abrupt and volatile resistive switching characteristics, which lead to neuron devices with stochastic integration-and-fire behavior, auto-recovery, and rapid operation. In contrast, the Ni/PZT/LSMO memory switching memristor exhibits gradual, non-volatile resistive switching behavior, which leads to synaptic devices with a high on/off ratio, low on-state current, low variability, and spike-timing-dependent plasticity (STDP). The divergent behavior of the ECM devices is attributed to greater control of cation migration through the ultrathin ferroelectric PZT. Thus, ECM devices with an identical ferroelectric electrolyte offer promise as essential building blocks in the construction of high-performance neuromorphic computing systems.
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spelling doaj.art-1708aceb8b284ddebf7737cea362762f2024-03-05T19:29:26ZengNature PortfolioNPG Asia Materials1884-40572023-05-0115111110.1038/s41427-023-00481-0Implementation of threshold- and memory-switching memristors based on electrochemical metallization in an identical ferroelectric electrolyteChansoo Yoon0Gwangtaek Oh1Sohwi Kim2Jihoon Jeon3Ji Hye Lee4Young Heon Kim5Bae Ho Park6Division of Quantum Phases & Devices, Department of Physics, Konkuk UniversityDivision of Quantum Phases & Devices, Department of Physics, Konkuk UniversityDivision of Quantum Phases & Devices, Department of Physics, Konkuk UniversityDivision of Quantum Phases & Devices, Department of Physics, Konkuk UniversityCenter for Correlated Electron Systems (CCES), Institute of Basic Science (IBS)Graduate School of Analytical Science and Technology, Chungnam National UniversityDivision of Quantum Phases & Devices, Department of Physics, Konkuk UniversityAbstract The use of an identical electrolyte in electrochemical metallization (ECM)-based neuron and synaptic devices has not yet been achieved due to their different resistive-switching characteristics. Herein, we describe ECM devices comprising the same ferroelectric PbZr0.52Ti0.48O3 (PZT) electrolyte, which can sustain both neuron and synaptic behavior depending on the identity of the active electrode. The Ag/PZT/La0.8Sr0.2MnO3 (LSMO) threshold switching memristor shows abrupt and volatile resistive switching characteristics, which lead to neuron devices with stochastic integration-and-fire behavior, auto-recovery, and rapid operation. In contrast, the Ni/PZT/LSMO memory switching memristor exhibits gradual, non-volatile resistive switching behavior, which leads to synaptic devices with a high on/off ratio, low on-state current, low variability, and spike-timing-dependent plasticity (STDP). The divergent behavior of the ECM devices is attributed to greater control of cation migration through the ultrathin ferroelectric PZT. Thus, ECM devices with an identical ferroelectric electrolyte offer promise as essential building blocks in the construction of high-performance neuromorphic computing systems.https://doi.org/10.1038/s41427-023-00481-0
spellingShingle Chansoo Yoon
Gwangtaek Oh
Sohwi Kim
Jihoon Jeon
Ji Hye Lee
Young Heon Kim
Bae Ho Park
Implementation of threshold- and memory-switching memristors based on electrochemical metallization in an identical ferroelectric electrolyte
NPG Asia Materials
title Implementation of threshold- and memory-switching memristors based on electrochemical metallization in an identical ferroelectric electrolyte
title_full Implementation of threshold- and memory-switching memristors based on electrochemical metallization in an identical ferroelectric electrolyte
title_fullStr Implementation of threshold- and memory-switching memristors based on electrochemical metallization in an identical ferroelectric electrolyte
title_full_unstemmed Implementation of threshold- and memory-switching memristors based on electrochemical metallization in an identical ferroelectric electrolyte
title_short Implementation of threshold- and memory-switching memristors based on electrochemical metallization in an identical ferroelectric electrolyte
title_sort implementation of threshold and memory switching memristors based on electrochemical metallization in an identical ferroelectric electrolyte
url https://doi.org/10.1038/s41427-023-00481-0
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